Join Anritsu and GRL for this free 1- hour webinar to gain a greater understanding of PCI Express®️ 5.0 test methodologies, and discuss anticipated signal integrity-related design and test challenges as the standard moves to PAM4 signaling, including power dissipation, signal-to-noise ratio, reflections, and cost/performance.

Presenters: Hiroshi Goto - Business Development Manager & Product Manager, High Speed and Optical at Anritsu Company, Darren Gray - Global Product Manager of Express Receiver Test Automation Solutions at GRL, Eugene Sushansky - Director of Global Engineering at GRL

The shift to 5th generation technology creates a number of challenges. This webinar will assist by providing a greater understanding of current 5G technology.

5G is the newest communication standard that is changing the world. Unlike the previous standards, 5G communication has introduced the use of higher frequency allocations, especially in the microwave range around 37-43.5 GHz. In parallel, there is increased interest in millimeter frequencies applications up to 110 GHz. Test and measurement equipment has reacted to this interest with new frequency offerings in both the 43.5 GHz range as well as 110 GHz, but components have not quite caught up. The need for components that can access these frequencies is more crucial than ever. These new components not only have to meet frequency demands, but hard specifications and traceability are also a necessity for establishing measurement compliance and credibility.

Presenter: Charles Tumbaga, Product Marketing Engineer, Anritsu Company

Measuring transmission parameters with a traditional vector network analyzer (VNA) over distance requires long test port cables, which increases signal loss and reduces measurement stability. This creates the need to use very expensive, high-end VNAs to be able to overcome these issues, and it also increases cost-of-test and limits where and how measurements can be taken. This webinar will discuss a new, more portable solution that can meet the frequency and measurement requirements of these long S-parameter transmission applications.

Presenter: Stan Oda, Product Manager, ShockLine Vector Network Analyzers