Electronic Test and Instrumentation

Configures digital lines as inputs, outputs, counters/timers, or custom communication protocols using FPGA-based logic for PXI systems.

Integrates an instrument into your system using a GPIB interface.

Performs voltage, current, resistance, temperature, and frequency/period measurements, as well as diode tests, as a part of PC-based systems.

Provides digital input and output capabilities for computer-based systems.

Provides frequency and counting measurements of periodic signals for CompactDAQ and CompactRIO systems.

Provides precise voltage or current sourcing and measurement capabilities for PXI systems.

Supplies programmable DC power for applications ranging from characterization, design validation, and manufacturing test.

Acquires and analyzes time- and frequency‐domain analog signals as part of a PXI system.

Connect multiple inputs to a single output, or multiple outputs to a single input, to simplify wiring in automated test systems.

Connect any input to any output to simplify wiring in automated test systems.

Integrates non-PXI instruments into your PXI system using the GPIB standard.

Enables Ethernet-based communication between PXI hardware and external instruments and devices and supports GigE Vision cameras without power over Ethernet (PoE).

Performs characterization and production test of semiconductor devices with timing sets and per channel pin parametric measurement unit (PPMU).

Performs voltage, current, resistance, temperature, inductance, capacitance, and frequency/period measurements, as well as diode tests, in PXI systems.

Provides digital input and output capabilities for PXI systems.