Products

A versatile probe station with sample temperatures as low as 4.2 K (standard) and 1.6 K (optionally).

An affordable tabletop station for on-wafer probing at 4.2 K to 475 K temperatures (standard).

An affordable, fully specified four-arm tabletop station for on-wafer probing at 4.2 K to 475 K temperatures.

6 Channel Oscilloscope with up to 1.5 GHz Bandwidth

4 Channel Oscilloscope with up to 1.5 GHz Bandwidth

Large selection of test chambers for testing batteries of any size.

Mixed Signal Oscilloscope, up to 500 MHz Bandwidth

Mixed Signal Oscilloscope, up to 500 MHz Bandwidth

Heat sink chips, heat sink bobbins, and other cryogenic accessories.

Cable for use in cryogenic environments.

A variety of wire types for cryogenic sensor installations.

A compact single-channel instrument for cryogenic temperature monitoring.

A versatile instrument with 8 sensor channels for temperature monitoring.

An instrument with 12 sensor channels for maximum monitoring capability.

Convenient, modular solutions for precision monitoring of sensors in large-scale PLC-based applications