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  1. DAS240 Series
    DAS240 Series
    BK DAS240 Series

    Multi-Channel Handheld Recorder without battery

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    Multi-Channel Handheld Recorder without battery

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  2. 8400 Series Hall Effect Measurement System
    8400 Series Hall Effect Measurement System
    8404/8407

    A complete Hall effect measurement system to facilitate the broadest range of research.

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    A complete Hall effect measurement system to facilitate the broadest range of research.

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  3. FastHall™ Station
    FastHall™ Station
    HMS-TT-MAN

    FastHall™ measurement capability contained in an integrated, high-precision tabletop characterization system.

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    FastHall™ measurement capability contained in an integrated, high-precision tabletop characterization system.

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  4. M91 FastHall™ Measurement Controller
    M91 FastHall™ Measurement Controller
    M91

    An all‑in-one Hall effect analysis instrument for making better measurements faster.

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    An all‑in-one Hall effect analysis instrument for making better measurements faster.

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  5. Model CRX-EM-HF Cryogenic Probe Station
    Model CRX-EM-HF Cryogenic Probe Station
    CRX-EM-HF

    A cryogen-free station with a ±0.6 T horizontal, in-plane electromagnet.

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    A cryogen-free station with a ±0.6 T horizontal, in-plane electromagnet.

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  6. PS-HM-8425 Hall Measurement Package for the CRX-VF Probe Station
    PS-HM-8425 Hall Measurement Package for the CRX-VF Probe Station
    PS-HM-8425

    A complete solution for enabling Hall measurements in a CRX-VF probe station.

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    A complete solution for enabling Hall measurements in a CRX-VF probe station.

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  7. Model CRX-VF Cryogenic Probe Station
    Model CRX-VF Cryogenic Probe Station
    CRX-VF

    A cryogen-free station with a ±2.5 T vertical field superconducting magnet.

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    A cryogen-free station with a ±2.5 T vertical field superconducting magnet.

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  8. Model CRX-4K Cryogenic Probe Station
    Model CRX-4K Cryogenic Probe Station
    CRX-4K

    Lake Shore’s premium cryogen-free station for probing at temperatures as low as 4.5 K.

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    Lake Shore’s premium cryogen-free station for probing at temperatures as low as 4.5 K.

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  9. Model CRX-6.5K Cryogenic Probe Station
    Model CRX-6.5K Cryogenic Probe Station
    CRX-6.5K

    A general-purpose, cryogen-free station for probing at 8 K to 350 K temperatures.

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    A general-purpose, cryogen-free station for probing at 8 K to 350 K temperatures.

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  10. Model FWPX Cryogenic Probe Station
    Model FWPX Cryogenic Probe Station
    FWPX

    A 4.5 K station designed for researchers who require large-size wafer probing.

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    A 4.5 K station designed for researchers who require large-size wafer probing.

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  11. Model EMPX-H2 Cryogenic Probe Station
    Model EMPX-H2 Cryogenic Probe Station
    EMPX-H2

    A 4.5 K station with an integrated 0.6 T horizontal field electromagnet.

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    A 4.5 K station with an integrated 0.6 T horizontal field electromagnet.

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  12. Model CPX-VF Cryogenic Probe Station
    Model CPX-VF Cryogenic Probe Station
    CPX-VF

    A 4.2 K station with an integrated ±2.5 T vertical field superconducting magnet.

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    A 4.2 K station with an integrated ±2.5 T vertical field superconducting magnet.

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  13. Model CPX Cryogenic Probe Station
    Model CPX Cryogenic Probe Station
    CPX

    A versatile probe station with sample temperatures as low as 4.2 K (standard) and 1.6 K (optionally).

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    A versatile probe station with sample temperatures as low as 4.2 K (standard) and 1.6 K (optionally).

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  14. Model TTPX Tabletop Cryogenic Probe Station
    Model TTPX Tabletop Cryogenic Probe Station
    TTPX

    An affordable tabletop station for on-wafer probing at 4.2 K to 475 K temperatures (standard).

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    An affordable tabletop station for on-wafer probing at 4.2 K to 475 K temperatures (standard).

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  15. Model PS-100 Tabletop Cryogenic Probe Station
    Model PS-100 Tabletop Cryogenic Probe Station
    PS-100

    An affordable, fully specified four-arm tabletop station for on-wafer probing at 4.2 K to 475 K temperatures.

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    An affordable, fully specified four-arm tabletop station for on-wafer probing at 4.2 K to 475 K temperatures.

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Items 61-75 of 4239

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