Phabrix: Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces

Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces

The easiest way to accomplish network visibility is to implement a visibility architecture—which is an end-to-end infrastructure that enables physical and virtual network, application, and security visibility.

In the latest white paper by Phabrix, the use of Pseudo-Random Binary Sequences (PRBS) is discussed, along with bit-error rate tests (BERT) to provide a more flexible and complete method of stress testing serial digital interfaces.

In this whitepaper, PHABRIX discusses the use of pseudo-random binary sequences (PRBS - also referred to as pseudo-random bit sequences), along with bit-error rate tests (BERT – also referred to as bit-error ratio tests) to stress test serial digital interfaces. The purpose of any physical layer serial digital interface (PHY) is to transmit or receive data whilst preserving that data’s integrity. In practical systems the major cause of bit-errors is random noise. To stress test such systems, it is necessary to both generate a “noisy” bit stream and then analyse the output from the interface to determine the bit-error rate which represents the integrity of the data.

Download now to continue reading!

Phabrix Stress Testing

Speak with a Live Agent

Would you like to speak with a Technical Advisor to help pick the right instrument for your specific needs?

Click the Chat Now button in the bottom right corner to speak with a Testforce SystemsSupport Agent and even set up a 1-on-1 session with a Pro near you!

More from Testforce Academy