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Maury Microwave and Rohde & Schwarz: An Introduction To Nonlinear Time-Domain Load Pull And Behavioural Model Extraction

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FREE WEBINAR


An Introduction To Nonlinear Time-Domain Load Pull And Behavioural Model Extraction


Today’s cellular communications industry is setting extremely stringent efficiency criteria for Power Amplifiers (PAs) used within wireless transmitters. To this end, various high-efficiency power amplifier architectures are exploited. Often these architectures require the transistors within PAs to be biased in high-efficiency class of operation, such as class B, C, E, F, J etc. and rely heavily on the correct current and voltage waveforms at the intrinsic transistor plane.


The design of such PAs mandates very accurate non-linear transistor models enabling time-domain waveform simulations under varying load impedances. Enhanced Poly-Harmonic Distortion (EPHD) transistor models are uniquely suited for such simulations as they are extracted from the time-domain current and voltage waveform information obtained during the large-signal analyzer-based load-pull measurements under variable load conditions.


This webinar will introduce the topic of load-pull, cover various conventional load-pull measurement techniques, large-signal analyzer based load-pull enabling the time-domain waveform measurements of active devices, and the enhanced poly-harmonic distortion transistor modelling methodology. Finally, the extracted device model will be simulated in a harmonic balance-based circuit simulator and compared against the measured results.


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More about "An Introduction To Nonlinear Time-Domain Load Pull And Behavioural Model Extraction" & FAQ


How much does this Nonlinear Time-Domain load pull training cost?

This training is 100% free!


What topics will you cover?

This webinar will introduce the topic of load-pull, cover various conventional load-pull measurement techniques, large-signal analyzer based load-pull enabling the time-domain waveform measurements of active devices, and the enhanced poly-harmonic distortion transistor modelling methodology.



About the Presenters


Joe Mallon

Joe Mallon, Business Development Manager, Rohde & Schwarz

Joe Mallon has 39 years of experience working in the RF and Microwave industry on both the commercial wireless as well as the Space and Defense markets. Throughout his career, he has held a variety of positions including Engineering, Sales and Sales Management. Joe has held positions at Motorola, Lockheed Martin, Anaren Microwave, Crane Electronics and Anritsu. In his current position at Rohde & Schwarz he serves as a Business Development Manager for R&S’s line of Vector Network Analyzers. Joe holds a BSEE degree from Drexel University in Philadelphia, Pennsylvania.

Jonas Urbonas

Jonas Urbonas, Senior Product Engineer, Maury Microwave Inc.

Jonas Urbonas received the B.Eng and Ph.D. degrees in Electronic Engineering from the University of Surrey, Guildford, United Kingdom in 2015 and 2019 respectively. He joined Maury Microwave Inc. in 2019 as a senior product engineer where he specializes in large-signal RF and microwave device characterization, and new measurement solutions’ development and implementation. Dr. Urbonas is a member of the IEEE Microwave Theory and Techniques and Instrumentation and Measurement societies. In 2019, he was awarded The ARFTG Roger Pollard Student Fellowship in Microwave Measurements and won the best paper award at the 91st ARFTG Microwave Measurement Conference.




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