Electro Optical Measurements using Anritsu VNAs

Electro-Optical Measurements Using Anritsu VNAs

An accurate, flexible & cost-effective technique to conduct electro-optical testing using VNAs.

As the data rates of optical communication systems continue to increase, optical transmit and receive modules require characterization to wider bandwidths. Optical modulators (E/O devices), photo detectors and receivers (O/E devices), as well as optical components can be characterized accurately using vector network analyzers (VNAs). This paper describes the techniques and hardware required to characterize these components with economies of scale and flexibility not present in current lightwave component analyzer (LCA) designs.

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Electro Optical Measurements using Anritsu VNAs

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