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Your education and sourcing hub for everything related to semiconductor design and manufacturing.

Learn about the latest technologies and industry standards by joining online or local training events, and taking advantage of free resources such as white papers and app notes.

New semiconductor materials, such as SiC and GaN, often introduce unique challenges during development.

DC semiconductor characterization requires comprehensive I-V, C-V and fast pulsed measurements.

  • Testing high power semiconductor devices drives the need for higher voltages and power levels, faster switching times, higher peak currents and lower leakage currents.

  • Semiconductor production environments need automation, probe station integration, speed and throughput for die sort, wafer acceptance and reliability tests.

  • High speed digital interfaces necessitate faster PHY validation cycles. Speedier debugging, protocol decoding and identifying jitter & noise from sources such as crosstalk are critical requirements for designers.

See below to download technical documents and discover how our cutting edge solutions can help you.

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