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Calibration Substrate The AC-series of calibration substrates offers up to 26 sets of standards for wafer-level SOLT, LRM probe-tip calibration for GS/SG and GSG probes. Five coplanar lines provide the broadband reference multiline TRL calibration as well as accuracy verification of conventional methods. Right-angled reciprocal elements are added to support the SOLR calibration of the system with the right-angled configuration of RF probes. The calibration substrate for wide-pitch probes is also available. Probe Configuration: GSG, GS/SG Supported probe pitch: 250 to 1250 μm Number of SOLT standard groups: GSG: 7, GS: 7, SG: 7 Number of verification and calibration lines: GSG: 2, GS: 1

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