Free shipping on online orders over $250


Calibration Substrate The AC-series of calibration substrates offers up to 26 sets of standards for wafer-level SOLT, LRM probe-tip calibration for GS/SG and GSG probes. Five coplanar lines provide the broadband reference multiline TRL calibration as well as accuracy verification of conventional methods. Right-angled reciprocal elements are added to support the SOLR calibration of the system with the right-angled configuration of RF probes. The calibration substrate for wide-pitch probes is also available. Probe Configuration: GS/SG Supported probe pitch: 50 to 250 μm Number of SOLT standard groups: 26 Number of verification and calibration lines: 5

Search engine powered by ElasticSuite © Testforce Systems Inc. 2024. All Rights Reserved.