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The Advanced Semiconductor Test (AST) division is built on a unique combination of manufacturing excellence and systems reliability incorporated from MPI's worldwide market leadership position in LED Test Equipment, and decades of engineering probe systems market expertise from the AST management team.
By developing Test Solutions, with features based upon creative ideas, a tremendous amount of knowledge obtained from long-term market interactions and becoming part of an existing MPI customer centric culture, the AST division is proud to offer outstanding Engineering Probe Systems and RF Probes products, global service, and superior application support with unsurpassed values.
For more information, a quote, or to speak with a Technical Account Manager, click the "Chat Now" button in the bottom right corner of this page.
ThermalAir TA-5000 SeriesTA-5000 SeriesCompact Portable bench top environmental heating and cooling temperature forcing air steam system.
Learn MoreCompact Portable bench top environmental heating and cooling temperature forcing air steam system.
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TS200-THZMPI-TS200-THZEngineering Probe System for emerging THz applications such as high-speed 5G communication, satellites, non-invasive spectroscopy, security and surveillance, medical and health care equipment, and short range automotive radar by adding active impedance tuner integrations on the same probe stations.
Learn MoreEngineering Probe System for emerging THz applications such as high-speed 5G communication, satellites, non-invasive spectroscopy, security and surveillance, medical and health care equipment, and short range automotive radar by adding active impedance tuner integrations on the same probe stations.
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TITAN Multi-Contact ProbeMPI-TITANTITANTM Multi-Contact Probe advances MPI proprietary TITANTM RF probing technology for characterization of RF ICs. It's up to 15 contacts which can be individually configured as either RF, logic signal and bypass power supply of RF IC.
Learn MoreTITANTM Multi-Contact Probe advances MPI proprietary TITANTM RF probing technology for characterization of RF ICs. It's up to 15 contacts which can be individually configured as either RF, logic signal and bypass power supply of RF IC.
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TS2500MPI-TS2500-A-0200 mm Fully Automated Probe System For RF Production Test Measurements
Learn More200 mm Fully Automated Probe System For RF Production Test Measurements
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QalibriaRF Calibration Software
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AC-5Calibration Substrate
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AC-3Calibration Substrate
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AC-2Calibration Substrate
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Dual T67MPI-DUAL-T67-A-0TITAN 67 GHz Dual Probes for Characterization of Multiport and Differential RF ICs
Learn MoreTITAN 67 GHz Dual Probes for Characterization of Multiport and Differential RF ICs
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T110MPI-T110-A-0TITAN 110 GHz RF Probes for Device Modeling and IC's Design Applications
Learn MoreTITAN 110 GHz RF Probes for Device Modeling and IC's Design Applications
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T67MPI-T67-A-0TITAN 67 GHz RF Probes for Device Modeling and IC's Design Applications
Learn MoreTITAN 67 GHz RF Probes for Device Modeling and IC's Design Applications
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T50MPI-T50-A-0TITAN 50 GHz RF Probes for Device Modeling and IC's Design Applications
Learn MoreTITAN 50 GHz RF Probes for Device Modeling and IC's Design Applications
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T40MPI-T40-A-0TITAN 40 GHz RF Probes for Device Modeling and IC's Design Applications
Learn MoreTITAN 40 GHz RF Probes for Device Modeling and IC's Design Applications
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T26MPI-T26-A-0TITAN 26 GHz RF Probes for Wireless Applications
Learn MoreTITAN 26 GHz RF Probes for Wireless Applications
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TS300Engineering Probe System
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